Sonstiges 2016

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Abstract  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;
Study of GeSn/(Si)Ge(Sn) Quantum Structures for Light Emitters
SPIE Europe, BrüsselBrüssel, Belgien, 3 Apr 2016 - 7 Apr 20162016-04-032016-04-07 OpenAccess  Download fulltext Files  Download fulltextFulltext by OpenAccess repository BibTeX | EndNote: XML, Text | RIS

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Scanning Probe Microscopy
Memristive Phenomena - From Fundamental to Neuromorphic Computing Jülich : Forschungszentrum Jülich 619 pp. () BibTeX | EndNote: XML, Text | RIS

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Ternary Rare Earth Based Oxides for Nitride Based Devices
Pennington, NJ : Electrochemical Society (ECS), ECS transactions 72, 307 - 317 () [10.1149/07202.0307ecst]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Zig-zag self-assembly of magnetic octahedral Fe3O4 nanocrystals using in situ liquid transmission electron microscopy
3rd International Conference on In Situ and Correlative Electron Microscopy, SaarbrückenSaarbrücken, Germany, 11 Oct 2016 - 12 Oct 20162016-10-112016-10-12 36 - 37 () BibTeX | EndNote: XML, Text | RIS

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Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays
PICO 2017, Kasteel VaalsbroekKasteel Vaalsbroek, The Netherlands, 30 Apr 2017 - 4 May 20172017-04-302017-05-04 Amsterdam : Elsevier Science () BibTeX | EndNote: XML, Text | RIS

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Introduction to a Special Issue on Frontiers of Aberration Corrected Electron Microscopy dedicated to Harald Rose on the occasion of his 80th Birthday
Pico 2015, Kasteel VaaslbroekKasteel Vaaslbroek, The Netherlands, 19 Apr 2015 - 23 Apr 20152015-04-192015-04-23 Amsterdam : Elsevier Science () BibTeX | EndNote: XML, Text | RIS

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Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors
Microscopy and Microanalysis, ColumbusColumbus, OH, 24 Jul 2016 - 28 Jul 20162016-07-242016-07-28 New York, NY : Cambridge University Press 484 - 485 () BibTeX | EndNote: XML, Text | RIS

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(Si)GeSn nanostructures for light emitters
SPIE Photonics Europe, BrusselsBrussels, Belgium, 3 Apr 2016 - 7 Apr 20162016-04-032016-04-07 98910W-1-98910W-9 () [10.1117/12.2227573]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Quantitative measurement of the charge distribution along a tungsten nanotip using transmission electron holography
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02 Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 737 - 738 () [10.1002/9783527808465.EMC2016.6252]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Low dose electron holography using direct-electron detection camera
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 769 - 770 () [10.1002/9783527808465.EMC2016.6971]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Fabrication and characterization of a fine electron biprism on a Si-on-insulator MEMS chip
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 699 - 700 () [10.1002/9783527808465.EMC2016.6259]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Automated in situ transmission electron microscopy experiments
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress, LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 638 - 639 () [10.1002/9783527808465.EMC2016.6434]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Limitations and challenges in off-axis electron holography of electromagnetic fields in nanoscale materials
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 677 - 678 () [10.1002/9783527808465.EMC2016.8663]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Growth and degradation of advanced octahedral Pt-alloy nanoparticle catalysts for fuel cells
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 800 - 801 () [10.1002/9783527808465.EMC2016.6030]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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In situ TEM analysis of structural changes in metal-halide perovskite solar cells under electrical bias
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 804 - 805 () [10.1002/9783527808465.EMC2016.6370]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Atomic resolution HR(S)TEM and EDXS analyses of GaInAs/GaSb and GaInP/GaSb bond interfaces for high-efficiency solar cells
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress, LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 846 - 847 () [10.1002/9783527808465.EMC2016.6029]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Magnetic imaging of skyrmions in FeGe using off-axis electron holography
European Microscopy Congress 2016: Proceedings / Kovács, András ;ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 739 - 740 () [10.1002/9783527808465.EMC2016.6276]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Magnetic Skyrmions in an FeGe Nanostripe Revealed by in situ Electron Holography
European Microscopy Congress 2016: Proceedings / Li, Zi-An ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 974 - 975 () [10.1002/9783527808465.EMC2016.6263]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Electron beam lithography for the realization of electron beam vortices with large topological charge ( L=1000ħ)
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 390 - 391 () [10.1002/9783527808465.EMC2016.5721]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Electron tomography with sub-5-second temporal resolution for dynamic in situ transmission electron microscopy
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 21 - 22 () [10.1002/9783527808465.EMC2016.6191]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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The influence of Yb and Bi doping on the thermoelectric properties of Mg2Si0.4Sn0.6 studied using transmission electron microscopy
European Microscopy Congress 2016: Proceedings / Mohamadi, Maryam Beig ;ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 1046 - 1047 () [10.1002/9783527808465.EMC2016.6207]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Nitride layers grown on patterned graphene/SiC
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 630 - 631 () [10.1002/9783527808465.EMC2016.6338]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Generation of super-oscillatory electron beams beyond the diffraction limit
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 731 - 732 () [10.1002/9783527808465.EMC2016.6221]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Scanning electron diffraction using the pnCCD (S)TEM Camera
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 641 - 641 () [10.1002/9783527808465.EMC2016.5224]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Imaging of Electric Fields with the pnCCD (S)TEM Camera
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 376 - 377 () [10.1002/9783527808465.EMC2016.6328]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Quantitative STEM - From composition to atomic electric fields
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 552 - 553 () [10.1002/9783527808465.EMC2016.8302]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Extending the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 51 - 52 () [10.1002/9783527808465.EMC2016.5295]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Double crystal interference experiments
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 711 - 712 () [10.1002/9783527808465.EMC2016.5140]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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2016Decoupling of valence and coordination number contributions at perovskite surfaces
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 934- 935 () [10.1002/9783527808465.EMC2016.6949]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Atomic structure and magnetic circular dichroism of antiphase boundary defects in NiFe2O4 thin films
European Microscopy Congress 2016: Proceedings / Wang, Zechao ; ISBN: 9783527808465
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 1058 pp. () [10.1002/9783527808465.EMC2016.6384] BibTeX | EndNote: XML, Text | RIS

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Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2
European Microscopy Congress 2016: Proceedings
16th European Microscopy Congress (EMC 2016), LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA 417 - 418 () [10.1002/9783527808465.EMC2016.6494]  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

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Generation of super-oscillatory beams beyond the diffraction limit
the 16th European Microscopy Congress, LyonLyon, France, 28 Aug 2016 - 2 Sep 20162016-08-282016-09-02 Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA () BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Lecture (Invited)
Rastertunnelmikroskopie und- Spektroskopie von III-V Halbleiter Nanodrähten
Lecture at EFDS Workshop: von Nano bis Makro: neue bildgebende Untersuchungsverfahren für Qualitätskontrolle und Materialforschung (Dresden, Deutschland), 8 Nov 2016 - 9 Nov 20162016-11-082016-11-09 BibTeX | EndNote: XML, Text | RIS

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Electrostatic biprism
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Measuring Instrument, electrical resistance elements and measuring System for measuringtime - variable magnetic fields or field gradients
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Reproducible step edge Josephson junction
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Sputtering sources for high-pressure sputtering with large targets and sputtering method
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Verfahren und Vorrichtungen zur Modulation eines Strahls elektrisch geladener Teilchen sowie Anwendungsbeispiele für die praktische Anwendung solcher Vorrichtungen
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Verfahren und Vorrichtungen zur Modulation eines Strahls elektrisch geladener Teilchen sowie Anwendungsbeispiele für die praktische Anwendung solcher Vorrichtungen
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Ionically controlled three-gate component
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Tunable Ampere phase plate for charged particle imaging systems
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Letzte Änderung: 16.02.2024